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Magnetic, electronic, and structural investigation of the strongly correlated Y_{1-x}Sm_{x}Co_{5} system
by F. Passos, D. Cornejo, M. Fantini, G. Nilsen, V. Martelli, J. Larrea Jiménez
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Submission summary
| Authors (as registered SciPost users): | Fernando Passos |
| Submission information | |
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| Preprint Link: | scipost_202208_00035v1 (pdf) |
| Date submitted: | 2022-08-15 17:58 |
| Submitted by: | Passos, Fernando |
| Submitted to: | SciPost Physics Proceedings |
| Proceedings issue: | International Conference on Strongly Correlated Electron Systems (SCES2022) |
| Ontological classification | |
|---|---|
| Academic field: | Physics |
| Specialties: |
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| Approach: | Experimental |
Abstract
SmCo$_5$ and YCo$_5$ are isostructural compounds both showing large magnetocrystalline anisotropy, where the former originates mainly from the crystal-electric field and magnetic interactions. We investigate the contribution of both interactions by partially substituting Y by Sm in as-cast polycrystalline Y$_{1-x}$Sm$_{x}$Co$_5$ (with $x$=0, 0.1, 0.2, 0.3, and 0.4) and measuring their structural, magnetic, and electrical properties through X-ray diffraction, magnetization, and electrical transport measurements. Our results suggest an interplay between microstructure strain in as-cast samples and the electronic and magnetic interactions.
Current status:
Reports on this Submission
Report #1 by Anonymous (Referee 1) on 2022-11-2 (Invited Report)
- Cite as: Anonymous, Report on arXiv:scipost_202208_00035v1, delivered 2022-11-02, doi: 10.21468/SciPost.Report.6031
Strengths
1.) The manuscript describes the influcence of Sm-doping on the structural, magnetic, and electrical properties of polycrystalline Y1−x Smx Co5 (with x=0, 0.1, 0.2, 0.3, and 0.4). The main result is the interplay between microstructure strain of the different samples and their electronic and magnetic interactions.
2.) The paper is clearly written and presents new and important results of this class of magnetic materials.
Weaknesses
1.) I recommend to comment on the error bars of the Sm-concentration x for the polycrytalline samples or add a reference for typical variations in the Sm- concentrations for related systems.
2.) I strongly recomment to add the transport data for x = 0.1 and x = 0.4 and the fits according eq. 3, since their fitting parameters are presented in fig. 7
Report
As stated above the paper is clearly written and deserves publication in
the proceedings of the SCES conference. However, I strongly
recommend to show the transport data for x =0.1 and x = 0.4 in figure 6.
Requested changes
1.) comment on the error bars for the Sm concentration (see above)
2.) add the data for x = 0.1 and x = 0.4 in fig. 6 (see above)
Author: Fernando Passos on 2023-01-23 [id 3262]
(in reply to Report 1 on 2022-11-02)We thank the referee for his/her work revising our manuscript, where he/she judges our manuscript deserves a publication in the conference proceedings after minor corrections. We performed EDS measurements on our samples to determine the stoichiometry with the respective error bars. We are resubmitting our manuscript including all the corrections the referee pointed out.