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Fidelity decay and error accumulation in random quantum circuits

Nadir Samos Sáenz de Buruaga, Rafał Bistroń, Marcin Rudziński, Rodrigo M. C. Pereira, Karol Życzkowski, Pedro Ribeiro

SciPost Phys. 19, 013 (2025) · published 8 July 2025

Abstract

Fidelity decay captures the inevitable state degradation in any practical implementation of a quantum process. We devise bounds for the decay of fidelity for a generic evolution given by a random quantum circuit model that encompasses errors arising from the implementation of two-qubit gates and qubit permutations. We show that fidelity decays exponentially with both circuit depth and the number of qubits raised to an architecture-dependent power and we determine the decay rates as a function of the amplitude of the aforementioned errors. Furthermore, we demonstrate the utility of our results in benchmarking quantum processors using the quantum volume figure of merit and provide insights into strategies for improving processor performance. These findings pave the way for understanding how states evolving under generic quantum dynamics degrade due to the accumulation of different kinds of perturbations.

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