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Interferometric microscale measurement of refractive index at VIS and IR wavelengths

Meguya Ryu, Simonas Varapnickas, Darius Gailevicius, Domas Paipulas, Eulalia Puig Vilardell, Zahra Khajehsaeidimahabadi, Saulius Juodkazis, Junko Morikawa, Mangirdas Malinauskas

SciPost Phys. Core 7, 059 (2024) · published 30 August 2024

Abstract

Determination of refractive index of micro-disks of a calcinated ($1100^\circ$C in air) photo-resist SZ2080$^\mathrm{TM}$ was carried out using transmission and reflection spectroscopy. Interference fringes at specific wavenumbers/wavelengths were selected for determination of the optical thickness, hence, the refractive index when the thickness of micro-disks was measured by scanning electron microscopy (SEM). Refractive index of disks of $\sim 6\pm 1~\mu$m thickness were determined at visible and IR (2.5-13~$\mu$m) spectral ranges and where $2.2\pm 0.2$ at visible and IR wavelengths. Peculiarities of optical characterisation of micro-optical structures are discussed in view of possible uncertainties in the definition of geometric parameters, shape and mass density redistribution.

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